Research Staff

Edward Gillman – Senior Research Scientist

Dr. Gillman obtained his Master's of Science degree in Physics in 1989 at Florida International University under the direction of Ken Hardy. He attended Florida State University where he received his Ph.D. in 1994 under the direction of Jim Skofronick. Following this, Dr. Gillman was a visiting research scientist at the Hitachi Advanced Research Laboratory in Sitama, Japan under the direction of Hrvoje Petek. At Hitachi he helped develop a new time-of-flight Helium scattering apparatus and modified a rotating detector Helium scattering system. From 1995 -1996 he was a post-doctoral resident at Tsukuba University with Shigehiko Yamamoto in the department of Applied Physics. In 1996, Dr. Gillman returned to the USA and accepted a post-doctoral position in the chemistry department at Florida State University with Klaus Dahmen, preparing and characterizing thin films of CMR manganites. In 1997, he accepted a joint position with Jefferson Lab and Norfolk State University infrared free-electron laser (FEL) technology. In 2002 he was named the UVA/NSU IGERT Distinguished Professor of Materials Science. He has also been a consultant for JEOL USA in scanned probe microscopy and is now a Senior Scientist for Senspex, specializing in nanoscale materials science and methods.